Micron and sub-micron sized aerosol particles are captured, manipulated and characterised in a Bessel beam optical trap. Bright field microscopy and elastic light scattering measurements are used in combination to interrogate trapped particles and explore the optical landscape of the trap. We conclude that the Bessel trap has a number of advantages over optical tweezers in terms of characterization of accumulation mode particles, manipulation of particles over macroscopic length scales and effective control of the gas phase. As such, the Bessel trap is a valuable addition to the aerosol optical toolkit.
Monday, December 7, 2009
Manipulation and characterisation of accumulation and coarse mode aerosol particles using a Bessel beam trap
Helena Meresman, Jon B. Wills, Michael Summers, David McGloin and Jonathan P. Reid
Micron and sub-micron sized aerosol particles are captured, manipulated and characterised in a Bessel beam optical trap. Bright field microscopy and elastic light scattering measurements are used in combination to interrogate trapped particles and explore the optical landscape of the trap. We conclude that the Bessel trap has a number of advantages over optical tweezers in terms of characterization of accumulation mode particles, manipulation of particles over macroscopic length scales and effective control of the gas phase. As such, the Bessel trap is a valuable addition to the aerosol optical toolkit.
Micron and sub-micron sized aerosol particles are captured, manipulated and characterised in a Bessel beam optical trap. Bright field microscopy and elastic light scattering measurements are used in combination to interrogate trapped particles and explore the optical landscape of the trap. We conclude that the Bessel trap has a number of advantages over optical tweezers in terms of characterization of accumulation mode particles, manipulation of particles over macroscopic length scales and effective control of the gas phase. As such, the Bessel trap is a valuable addition to the aerosol optical toolkit.
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