In Situ Measurement of Depletion Caused by SDBS Micelles on the Surface of Silica Particles Using Optical Tweezers

Shuai Liu, Yue Hu, Jing Xia, Shenwen Fang, Ming Duan

Dual-trap optical tweezers have been used to directly measure the interaction forces between two silica particles upon controlling the concentration of the ionic surfactant sodium dodecylbenzenesulfonate (SDBS). By capturing two silica particles in one spot optical trap and one linear optical trap and controlling the linear trap to bring one particle to approach another sufficiently closer, the interaction forces between these two particles can be measured as the separation distance changes. Results showed that with increasing concentrations of SDBS, the interaction force between the two silica particles emerges at closer surface distance between two silica particles. Only repulsive force exists between silica particles below the critical micelle concentration (cmc) of SDBS and it could be well-fitted using the classical Derjaguin–Landau–Verwey–Overbeek (DLVO) theory. However, the depletion attraction force appears above the cmc of SDBS which is induced by the generation of SDBS micelles. By in situ measurement of the interaction force between two silica particles in the presence of different concentrations of SDBS, the depletion force can be quantitatively calculated.

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