Near-field probing of Bloch surface waves in a dielectric multilayer using photonic force microscopy

Daniil A. Shilkin, Evgeny V. Lyubin, Irina V. Soboleva, and Andrey A. Fedyanin

The potential of photonic force microscopy (PFM) for probing the optical near-field in the vicinity of a dielectric multilayer is demonstrated. An experimental study of Bloch surface waves (BSWs) using PFM is described in detail. The applied technique is based on measuring the BSW-induced gradient force acting on a probe particle combined with precise control of the distance between the particle and the multilayer surface. The BSW-induced potential profile measured using PFM is presented. The force interaction between the probe and the BSW evanescent field is numerically studied. The results indicate that a polystyrene particle with a diameter of 1 μm does not significantly perturb the BSW field and can be used to probe the optical near-field intensity in an elegant, noninvasive manner.

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