In Soo Park, Se Hee Park, Sang Woo Lee, Dae Sung Yoon and Beop-Min Kim
We report a method to precisely quantify dielectrophoretic (DEP) forces and cutoff frequencies (f c) of viable and nonviable yeast cells. The method consists of a two-step process in which generated DEP forces act upon a cell through a micro-electrode device, followed by direct measurement of DEP forces using optical tweezers. DEP behaviors of viable and nonviable yeast cells are monitored as a function of AC frequency. We believe that the proposed method can be used as a powerful platform for cell-based assays to characterize the DEP behavior of various cell types including cancer and normal cells.
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