Calibration of nonspherical particles in optical tweezers using only position measurement

Ann A. M. Bui, Alexander B. Stilgoe, Timo A. Nieminen, and Halina Rubinsztein-Dunlop
Nonspherical probe particles are an attractive choice for optically-trapped scanning probe microscopy. We show that it is possible to calibrate a trap with a nonspherical particle using only position measurements, without requiring measurement of orientation, using a pseudopotential based on the position occupation probability. It is not necessary to assume the force is linear with displacement.

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