M Dienerowitz, G Gibson, F Dienerowitz and M Padgett
We have developed a workstation based on holographic tweezers to optically trap, move and characterize metal nanoparticles. Our advanced darkfield imaging system allows us to simultaneously image and take spectra of single trapped metal nanoparticles. We take advantage of the beamshaping abilities of the spatial light modulator and correct for aberrations of the trapping optics. We monitor the improvement of the optical trap with video-based nanoparticle tracking. Furthermore we theoretically assess the capabilities and limitations of video-based tracking for nanoparticle position detection, in particular with respect to acquisition frequencies below the corner frequency.
DOI
We have developed a workstation based on holographic tweezers to optically trap, move and characterize metal nanoparticles. Our advanced darkfield imaging system allows us to simultaneously image and take spectra of single trapped metal nanoparticles. We take advantage of the beamshaping abilities of the spatial light modulator and correct for aberrations of the trapping optics. We monitor the improvement of the optical trap with video-based nanoparticle tracking. Furthermore we theoretically assess the capabilities and limitations of video-based tracking for nanoparticle position detection, in particular with respect to acquisition frequencies below the corner frequency.
DOI
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