We have developed a cell palpation system, which enables to investigate mechanical properties of a cell in local with an optically manipulated particle. In this system, the particle attached on a cell surface is forced to move back-and-forth in sinusoidal manner by optical tweezers. Position of the particle position is recorded and analyzed to extract force exerted on the particle by using a physical model of the particle. We have demonstrated to measure cell membrane stiffness in local and temporal change of that with the detection limit of the force in pN order.
Tuesday, February 2, 2010
Cell Palpation System Based on a Force Measurement by Optical Tweezers for Investigation of Local Mechanical Properties of a Cell Membrane
Hideaki Miyoshi, Tadao Sugiura, and Kotaro Minato
We have developed a cell palpation system, which enables to investigate mechanical properties of a cell in local with an optically manipulated particle. In this system, the particle attached on a cell surface is forced to move back-and-forth in sinusoidal manner by optical tweezers. Position of the particle position is recorded and analyzed to extract force exerted on the particle by using a physical model of the particle. We have demonstrated to measure cell membrane stiffness in local and temporal change of that with the detection limit of the force in pN order.
We have developed a cell palpation system, which enables to investigate mechanical properties of a cell in local with an optically manipulated particle. In this system, the particle attached on a cell surface is forced to move back-and-forth in sinusoidal manner by optical tweezers. Position of the particle position is recorded and analyzed to extract force exerted on the particle by using a physical model of the particle. We have demonstrated to measure cell membrane stiffness in local and temporal change of that with the detection limit of the force in pN order.
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